Advances in Imaging and Electron Physics Volume 193
Hawkes, Peter WAdvances in Imaging and Electron Physics merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
- Contains contributions from leading authorities on the subject matter
- Informs and updates on all the latest developments in the field of imaging and electron physics
- Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electron, and ion emission with a valuable resource
- Features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing
Categorías:
Año:
2016
Edición:
First edition
Editorial:
Academic Press
Idioma:
english
Páginas:
140
ISBN 10:
0128052317
ISBN 13:
9780128052310
Serie:
Advances in Imaging and Electron Physics Volume 193
Archivo:
PDF, 4.79 MB
IPFS:
,
english, 2016