Advances in Imaging and Electron Physics 172
Jay Theodore Cremer (Eds.)This special volume of Advances in Imaging and Electron Physics details the current theory, experiments, and applications of neutron and x-ray optics and microscopy for an international readership across varying backgrounds and disciplines. Edited by Dr. Ted Cremer, these volumes attempt to provide rapid assimilation of the presented topics that include neutron and x-ray scatter, refraction, diffraction, and reflection and their potential application.
Key features:
* Contributions from leading authorities * Informs and updates on all the latest developments in the field
Categorías:
Año:
2012
Edición:
1
Editorial:
Academic Press
Idioma:
english
Páginas:
1
ISBN 10:
0123944228
ISBN 13:
9780123944221
Serie:
Advances in Imaging and Electron Physics 172
Archivo:
PDF, 27.19 MB
IPFS:
,
english, 2012